SEM EDS - Combining Power and Intuitive Operation
QUANTAX EDS from Bruker Nano is one of the most powerful systems commercially available for energy dispersive X-ray microanalysis (EDS) in association with scanning electron microscopy (SEM) and electron microprobe. It is actually quite sobering to consider that it is now well over 70 years since a US patent was issued to James Hillier concerning ‘Electron probe analysis employing x-ray spectrography'.
The idea that the chemical (elemental) composition of a sample can be characterised by X-rays emissions following excitation by a high-energy beam of charged particles is very powerful. In the case of the scanning electron microscope, where the method of image production involves the generation of such a beam, charged electrons in a raster scan pattern, the opportunity for energy, and wavelength, dispersive X-ray spectroscopy is self-evident and has been widely used in many microanalytical SEM EDS studies.
We are however now at an exciting stage in the development of the technique where SEM EDS microanalysis is being extended into nanoanalysis. One of the technological advances that has helped drive this trend, as exemplified in the XFlash detectors used in Bruker Nano's QUANTAX EDS, is the use of silicon drift x-ray detectors (SDD).
These detectors use very high purity silicon with a low leakage current and can be cooled by the Peltier effect - thermoelectric cooling. The upshot of this is that the vibration-causing, liquid nitrogen cooling that defined the early era of EDS is now a thing of the past. The XFlash detectors from Bruker Nano based on the ‘silicon drift chamber principle' are exceptionally small and lightweight; robust with cutting-edge radiation entrance window technology and completely maintenance free - and this means superior energy resolution.
The range of XFlash detectors available with the QUANTAX EDS will ensure that specifications can be matched to your exact EDS for SEM needs.
The ability to scale and tune the QUANTAX EDS to a wide range of analytical tasks goes hand-in-hand with an ‘intuitive' user interface that makes the system suitable for novices, whilst providing plenty of functionality for the expert.
This ESPRIT software suite provides tools for standardless and standard-based quantification, mapping and hypermapping, while the new TQuant package additionally included is specifically aimed at the standardless quantification of light elements and low energy peaks. It is all part of a system that really does advance SEM EDS to a new level - routine SEM EDS nanoanalysis is here.
Date added: 2015-05-25 14:18:10