Reflectance measurement Is A Breeze With Cecil
The Cecil Instruments ReflectaScan reflectance spectrophotometer is an instrument designed for universal reflectance measurements. With a scanning capability that covers samples from 190-1000 nm, an integrated printer to plot results (an external printer may also be used) and a wide range of reflectance measurement capabilities, the ReflectaScan is an all in one reflectance spectrophotometry solution.
Measurements can be made including:
-Diffuse and specular samples
-Specular excluded diffuse
-Diffuse of powder samples
-Transmittance of turbid or scattering samples
The ReflectaScan’s integrated compact sphere system allows this single system to make this broad range of measurements. The sphere is mounted in the sample compartment and is made from Spectralon, a material with higher reflectance across the visible and UV spectra than any other substance known. The sphere provides high energy throughput and thus outstanding performance, versatility and accuracy with substitution errors eliminated in all diffuse reflectance and transmittance measurements. The sphere has a separate dedicated silicon diode detector which operates on a separate signal channel.
Measurements can be performed without the use of the specular component by using the 0° sample rest. A 11° sample rest can be substituted for measuring total hemispherical reflectance.
Turbid or Scattering Samples
A 10mm pathlength cuvette holder is included in the sphere system for transmittance measurements of turbid or normal samples as well as scattering films.
The ReflectaScan has a dedicated specular unit for measuring coated ophthalmic lenses and other surfaces, making the instrument the perfect quality assurance solution for manufacturers of anti-reflection coated ophthalmic lenses. Many ReflectaScan systems are currently in use worldwide in this industry.
Measurement of Thin Films
The CE 3075 specular reflectance unit makes it simple to measure the thickness of films on a surface; such as an epitaxial film of silicon dioxide on a silicon wafer. A scan on films produces data on transmission minima and maxima based in the interference of energy reflected from the surface of the film and the reflected energy from the point where film meets substrate. Films as thin as .1 microns may be measured.
Cecil Instruments also provides software to enable calculations including metric color, chromaticity, Hunter, tristimulus values, yellowness, whiteness and more. Standard illuminant tables include CIE, A, B & C and CIE D50, D65 & D75; observer tables include 2° and 10° angles.
Date added: 2015-05-24 11:37:29